MEO Engineering Company, Inc.

Third-party service, upgrades, spare parts, consumables, and process development support for broad range of particle beam instrumentation, including Focused Ion Beam (FIB) systems manufactured by former Micrion Company, FIB and FIB/SEM equipment manufactured by FEI Company, and Scanning Electron Microscopy (SEM) tools from various SEM manufacturers including Zeiss, Leo, Hitachi, and industrial CD-SEM and DR-SEM tools manufactured by Opal and Applied Materials.

You can find us:

Web: www.partbeamsystech.com

Web: www.freudlabs.com

E-Mail: info@partbeamsystech.com

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Disclaimer:

MEO Engineering Company, Inc., D.B.A. "PBS&T" ("Particle Beam Systems and Technology") provides range of technological solutions, including third-party service, support, parts, and consumables for FIB, SEM, and dual-beam FIB/SEM instrumentation. PBS&T does not represent, not affiliated with, and not supported by OEMs of FIB, SEM, and FIB/SEM instrumentation. All trademarks identifying supported FIB, SEM, and FIB/SEM equipment and components are property of their respective owners and nominatively used for the sole purpose of accurately identifying equipment compatible with the parts and services provided by PBS&T, MEO Engineering Company, Inc.